Nanofilm: Surface and Thin Film Characterization

Since the introduction of the „Brewster Angle Microscope BAM1“ 1991, Nanofilm has become the leader in Brewster Angle Microscopy, Imaging Ellipsometry and UV/VIS reflectometry. We provide instrumentation for optical surface analysis of monolayers and thin film coatings at the air/water, the liquid/liquid, the solid liquid and the solid/gas interface.

Brewster Angle Microscopes

Imaging and characterization of monolayers at the air/water interface

Imaging Ellipsometer

Combining nulling ellipsometry with microscopy – ellipsometry with a lateral resolution down to 1 μm

UV/VIS Reflectometer

Investigation of orientation, association, adsorption and chemical change of chromophores.